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Alloy design model offers faster, more accurate predictions by factoring in material defects

One well-known example of such material defect that has been studied extensively over the past century, Upmanyu says, is a dislocation. It occurs when an entire atomic plane is missing from a ...
Nasdaq

Applied Materials Accelerates Chip Defect Review with Next-Gen eBeam System

SEMVision™ H20 enables better and faster analysis of nanoscale defects in leading-edge chips Second-generation “cold field emission” technology provides high-resolution imaging AI image recognition ...
Optics

New VIP™ (Vision Inspection Pack) Software Enables Simultaneous Evaluation of Light, Color, and Defects in Backlit Symbols

REDMOND, Wash. – May 18, 2020 — Radiant Vision Systems, a leading provider of test and measurement solutions for illuminated components and displays, announces a new software extension for its ...
Optics

Radiant Introduces New VIP™ (Vision Inspection Pack) Software License that Enables Simultaneous Evaluation of Light, Color, and Defects in Backlit Symbols

Radiant Vision Systems, a leading provider of test and measurement solutions for illuminated components and displays, announces a new software extension for its TrueTest™ Automated Visual Inspection ...